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| absolute maximum ratings parameter units i d @ v gs = 12v, t c = 25c continuous drain current 75* i d @ v gs = 12v, t c = 100c continuous drain current 75* i dm pulsed drain current 300 p d @ t c = 25c max. power dissipation 250 w linear derating factor 2.0 w/c v gs gate-to-source voltage 20 v e as single pulse avalanche energy 500 mj i ar avalanche current 75 a e ar repetitive avalanche energy 25 mj dv/dt peak d iode recovery dv/dt 4.4 v/ns t j operating junction -55 to 150 t stg storage temperature range pckg. mounting surface temp. 300 (for 5s) weight 3.3 (t ypical) g pre-irradiation international rectifier?s r5 tm technology provides high performance power mosfets for space applications. these devices have been characterized for single event effects (see) with useful performance up to an let of 80 (mev/(mg/cm 2 )). the combination of low r ds(on) and low gate charge reduces the power losses in switching applications such as dc to dc converters and motor control. these devices retain all of the well established advantages of mosfets such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters. c a www.irf.com 1 * current is limited by package features: single event effect (see) hardened ultra low r ds(on) low total gate charge simple drive requirements ease of paralleling hermetically sealed surface mount ceramic package light weight for footnotes refer to the last page radiation hardened JANSR2N7468U2 power mosfet 60v, n-channel surface mount (smd-2) ref: mil-prf-19500/673 smd-2 product summary part number radiation level r ds(on) i d qpl part number irhna57064 100k rads (si) 0.0056 ? 75a* JANSR2N7468U2 irhna53064 300k rads (si) 0.0056 ? 75a* jansf2n7468u2 irhna54064 500k rads (si) 0.0056 ? 75a* jansg2n7468u2 irhna58064 1000k rads (si) 0.0065 ? 75a* jansh2n7468u2 irhna57064 technology pd-91852i
irhna57064, JANSR2N7468U2 pre-irradiation 2 www.irf.com electrical characteristics @ tj = 25c (unless otherwise specified) parameter min typ max units t est conditions bv dss drain-to-source breakdown voltage 60 ? ? v v gs = 0v, i d = 1.0ma ? bv dss / ? t j temperature coefficient of breakdown ? 0.065 ? v/c reference to 25c, i d = 1.0ma voltage r ds(on) static drain-to-source on-state ? ? 0.0056 ? v gs = 12v, i d = 75a resistance v gs(th) gate threshold voltage 2.0 ? 4.0 v v ds = v gs , i d = 1.0ma g fs forward transconductance 45 ? ? s v ds 15v, i ds = 75a i dss zero gate voltage drain current ? ? 10 v ds = 48v ,v gs = 0v ??25 v ds = 48v, v gs = 0v, t j = 125c i gss gate-to-source leakage forward ? ? 100 v gs = 20v i gss gate-to-source leakage reverse ? ? -100 v gs = -20v q g total gate charge ? ? 165 v gs =12v, i d = 45a q gs gate-to-source charge ? ? 55 nc v ds = 30v q gd gate-to-drain (?miller?) charge ? ? 65 t d (on) turn-on delay time ? ? 35 v dd = 30v, i d = 45a, t r rise time ? ? 125 v gs =12v, r g = 2.35 ? t d (off) turn-off delay time ? ? 60 t f fall time ? ? 50 l s + l d total inductance ? 4.0 ? c iss input capacitance ? 6080 ? v gs = 0v, v ds = 25v c oss output capacitance ? 2310 ? p f f = 1.0mhz c rss reverse transfer capacitance ? 90 ? na nh ns a thermal resistance parameter min typ max units t est conditions r thjc junction-to-case ? ? 0.5 r thj-pcb junction-to-pc board ? 1.6 ? c/w measured from the center of drain pad to center of source pad source-drain diode ratings and characteristics parameter min typ max units t est conditions i s continuous source current (body diode) ? ? 75* i sm pulse source current (body diode) ? ? 300 v sd diode forward voltage ? ? 1.3 v t j = 25c, i s = 75a, v gs = 0v t rr reverse recovery time ? ? 200 ns t j = 25c, i f = 45a, di/dt 100a/ s q rr reverse recovery charge ? ? 538 nc v dd 25v t on forward turn-on time intrinsic turn-on time is negligible. turn-on speed is substantially controlled by l s + l d . a note: corresponding spice and saber models are available on international rectifier web site. * current is limited by package www.irf.com 3 irhna57064, JANSR2N7468U2 table 1. electrical characteristics @ tj = 25c, post total dose irradiation parameter up to 500k rads(si) 1 1000k rads (si) 2 units test conditions min max min max bv dss drain-to-source breakdown voltage 60 ? 60 ? v v gs = 0v, i d = 1.0ma v gs(th) gate threshold voltage 2.0 4.0 1.5 4.0 v gs = v ds , i d = 1.0ma i gss gate-to-source leakage forward ? 100 ? 100 na v gs = 20v i gss gate-to-source leakage reverse ? -100 ? -100 v gs = -20 v i dss zero gate voltage drain current ? 10 ? 25 a v ds = 48v, v gs = 0v r ds(on) static drain-to-source ? 0.0061 ? 0.0071 ? v gs = 12v, i d = 45a on-state resistance (to-3) r ds(on) static drain-to-source ? 0.0056 ? 0.0065 ? v gs = 12v, i d = 45a on-state resistance (smd-2) international rectifier radiation hardened mosfets are tested to verify their radiation hardness capability. the hardness assurance program at international rectifier is comprised of two radiation environments. every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the to-3 package. both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions in order to provide a direct comparison. radiation characteristics 1. part numbers irhna57064 (JANSR2N7468U2), irhna53064 (jansf2n7468u2) and irhna54064 (jansg2n7468u2) 2. part number irhna58064 (jansh2n7468u2) fig a. typical single event effect, safe operating area v sd diode forward voltage ? 1.3 ? 1.3 v v gs = 0v, i s = 45a international rectifier radiation hardened mosfets have been characterized in heavy ion environment for single event effects (see). single event effects characterization is illustrated in fig. a and table 2. for footnotes refer to the last page table 2. typical single event effect safe operating area let ener gy ran g evds (v) ( mev/ ( m g /cm 2 )) ( mev ) ( m ) @vgs = @vgs = @vgs = @vgs = @vgs = 0v -5v -10v -15v -20v 38 5% 300 7.5% 38 7.5% 60 60 60 60 30 61 5% 330 7.5% 31 10% 46 46 35 25 15 84 5% 350 10% 28 7.5% 35 30 25 20 14 0 10 20 30 40 50 60 70 -20 -15 -10 -5 0 bias vgs (v) bias vds (v) let=38 5% let=61 5% let=84 5% irhna57064, JANSR2N7468U2 pre-irradiation 4 www.irf.com 15 10 100 1000 0.1 1 10 100 20s pulse width t = 25 c j top bottom vgs 15v 12v 10v 9.0v 8.0v 7.0v 6.0v 5.0v v , drain-to-source voltage (v) i , drain-to-source current (a) ds d 5.0v 10 100 1000 0.1 1 10 100 20s pulse width t = 150 c j top bottom vgs 15v 12v 10v 9.0v 8.0v 7.0v 6.0v 5.0v v , drain-to-source voltage (v) i , drain-to-source current (a) ds d 5.0v 10 100 1000 5.0 5.5 6.0 6.5 7.0 7.5 8.0 v = 25v 20s pulse width ds v , gate-to-source voltage (v) i , drain-to-source current (a) gs d t = 150 c j t = 25 c j -60 -40 -20 0 20 40 60 80 100 120 140 160 0.0 0.5 1.0 1.5 2.0 t , junction temperature ( c) r , drain-to-source on resistance (normalized) j ds(on) v = i = gs d 12v 75a www.irf.com 5 irhna57064, JANSR2N7468U2 ! ! " " " #$ 1 10 100 0 2000 4000 6000 8000 10000 v , drain-to-source voltage (v) c, capacitance (pf) ds v c c c = = = = 0v, c c c f = 1mhz + c + c c shorted gs iss gs gd , ds rss gd oss ds gd c oss c rss c iss 0 25 50 75 100 125 150 175 200 0 4 8 12 16 20 q , total gate charge (nc) v , gate-to-source voltage (v) g gs for test circuit see figure i = d 13 45a v = 30v ds v = 48v ds 10 100 1000 0.4 0.6 0.8 1.0 1.2 1.4 1.6 v ,source-to-drain voltage (v) i , reverse drain current (a) sd sd v = 0 v gs t = 25 c j t = 150 c j 45a pre-irradiation 0.1 1 10 100 v ds , drain-to-source voltage (v) 0.1 1 10 100 1000 i d , d r a i n - t o - s o u r c e c u r r e n t ( a ) tc = 25c tj = 150c single pulse 1ms 10ms operation in this area limited by r ds( on) 100 s dc irhna57064, JANSR2N7468U2 pre-irradiation 6 www.irf.com $ v ds 90% 10% v gs t d(on) t r t d(off) t f $ %& 1 0.1 % + - ' & ( )* " v gs 0.001 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 1 notes: 1. duty factor d = t / t 2. peak t = p x z + t 1 2 j dm thjc c p t t dm 1 2 t , rectangular pulse duration (sec) thermal response (z ) 1 thjc 0.01 0.02 0.05 0.10 0.20 d = 0.50 single pulse (thermal response) 25 50 75 100 125 150 0 40 80 120 160 t , case temperature ( c) i , drain current (a) c d limited by package www.irf.com 7 irhna57064, JANSR2N7468U2 q g q gs q gd v g charge d.u.t. v ds i d i g 3ma v gs .3 f 50k ? .2 f 12v current regulator same type as d.u.t. current sampling resistors + - +, ! -! %& & ' " . ( & %& . ( & t p v (br)dss i as pre-irradiation r g i as 0.01 ? t p d.u.t l v ds + - v dd driver a 15v 20v v gs 25 50 75 100 125 150 0 200 400 600 800 1000 starting t , junction temperature ( c) e , single pulse avalanche energy (mj) j as i d top bottom 33.5a 47.4a 75a irhna57064, JANSR2N7468U2 pre-irradiation 8 www.irf.com pulse width 300 s; duty cycle 2% total dose irradiation with v gs bias. 12 volt v gs applied and v ds = 0 during irradiation per mil-std-750, method 1019, condition a. total dose irradiation with v ds bias. 48 volt v ds applied and v gs = 0 during irradiation per mll-std-750, method 1019, condition a. repetitive rating; pulse width limited by maximum junction temperature. v dd = 25v, starting t j = 25c, l= 0.18mh peak i l = 75a, v gs = 12v i sd 45a, di/dt 196a/ s, v dd 60v, t j 150c case outline and dimensions ? smd-2 footnotes: ir world headquarters: 233 kansas st., el segundo, california 90245, usa tel: (310) 252-7105 ir leominster : 205 crawford st., leominster, massachusetts 01453, usa tel: (978) 534-5776 tac fax: (310) 252-7903 visit us at www.irf.com for sales contact information . data and specifications subject to change without notice. 10/2011 |
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